Scanning microscopy for nanotechnology : techniques and applications / edited by Weilie Zhou, Zhong Lin Wang.
Detalles de publicación: New York : Springer, 2007.Descripción: xiv, 522 p. : il. 25 cmISBN:- 0387333258 (hbk.)
- 9780387333250
Contenidos:
1. Fundamentals of scanning electron microscopy (SEM) / Weilie Zhou, Robert Apkarian, Zhong Lin Wang and David Joy -- 2. Backscattering detector and EBSD in nanomaterials characterization / Tim Maitland and Scott Sitzman -- 3. X-ray microanalysis in nanomaterials / Robert Anderhalt -- 4. Low kV scanning electron microscopy / M. David Frey -- 5. E-beam nanolithography integrated with scanning electron microscope / Joe Nabity, Lesely Anglin Compbell, Mo Zhu and Weilie Zhou -- 6. Scanning transmission electron microscopy for nanostructure characterization / S. J. Pennycook, A. R. Lupini, M. Varela, A. Borisevich, Y. Peng, M. P. Oxley, K. Van Benthem and M. F. Chisholm -- 7. Introduction to in-situ nanomanipulation for nanomaterials engineering / Rishi Gupta and Richard E. Stallcup II -- 8. Applications of FIB and dualbeam for nanofabrication / Brandon Van Leer, Lucille A. Giannuzzi and Paul Anzalone -- 9. Nanowires and carbon nanotubes / Jianye Li and Jie Liu -- 10. Photonic crystals and devices / Xudong Wang and Zhong Lin Wang -- 11. Nanoparticles and colloidal self-assembly / Gabriel Caruntu, Daniela Caruntu and Charles J. O'Connor -- 12. Nano-building blocks fabricated through templates / Feng Li and John B. Wiley -- 13. One-dimensional Wurtzite semiconducting nanostructures / Pu Xian Gao and Zhong Lin Wang -- 14. Bio-inspired nanomaterials / Peng Wang, Guobao Wei, Xiaohua Liu and Peter X. Ma -- 15. Cryo-temperature stages in nanostructural research / Robert P. Apkarian.
Tipo de ítem | Biblioteca actual | Signatura | Estado | Fecha de vencimiento | Código de barras | Reserva de ítems |
---|---|---|---|---|---|---|
Libro | FaMAF Sección Física | F 68.37 SCAm | Disponible | 22322 |
Total de reservas: 0
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